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高分辨三維X射線顯微成像系統(tǒng)━內(nèi)部結(jié)構(gòu)非破壞性的成像技術(shù)眼見為實!這是我們常常將顯微鏡應用于材料表征的原因。傳統(tǒng)的顯微鏡利用光或電子束，對樣品直接進行成像。其他的，如原子力顯微鏡（AFM），則利用傳感器來檢測樣品表面。這些方法都能夠提供樣品表面/近表面結(jié)構(gòu)或特性的局部二維圖像。但是，是否存在一種技術(shù)能實現(xiàn)以下幾點功能？☉內(nèi)部結(jié)構(gòu)三維成像？⊙一次性測量整個樣品？⊙直接檢測？⊙無需進行大量樣品制備，如更換或破壞樣品，就能實現(xiàn)上述目標？上海是什么顯微CT調(diào)試通過對樣品內(nèi)部非常細微的結(jié)構(gòu)進行無損成像,真正實現(xiàn)三維顯微成像。無需樣本品制備、嵌入、鍍層或切薄片。

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Max.samplesizeforhighestresolution(